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"Development of a Fail-Safe Microprocessor LSI with Self-Diagnosis ..."
Sei Takahashi et al. (2001)
- Sei Takahashi, Munehisa Taira, Hidetaka Saegusa, Takehiko Hoshino, Hideo Nakamura:
Development of a Fail-Safe Microprocessor LSI with Self-Diagnosis Mechanism Depending on an M-Sequence Code Signature. PRDC 2001: 191-198
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