"Efficient Built-in Self-Test Techniques for Memory-Based FFT Processors."

Shyue-Kung Lu, Chien-Hung Yeh, Han-Wen Lin (2004)

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DOI: 10.1109/PRDC.2004.1276582

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Shyue-Kung Lu, Chien-Hung Yeh, Han-Wen Lin:
Efficient Built-in Self-Test Techniques for Memory-Based FFT Processors. PRDC 2004: 321-326

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