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"Variability and sensitivity to process parameters variations in InGaAs ..."
Nicolo Zagni et al. (2017)
- Nicolo Zagni
, Francesco Maria Puglisi
, Giovanni Verzellesi
, Paolo Pavan
:
Variability and sensitivity to process parameters variations in InGaAs dual-gate ultra-thin body MOSFETs: A scaling perspective. PATMOS 2017: 1-5
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