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"Failure probability of a FinFET-based SRAM cell utilizing the most ..."
Michail Noltsis et al. (2017)
- Michail Noltsis, Eleni Maragkoudaki, Dimitrios Rodopoulos, Francky Catthoor, Dimitrios Soudris:
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point. PATMOS 2017: 1-8
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