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"Embedded toggle generator to control the switching activity during test of ..."

Leonidas Katselas et al. (2017)

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DOI: 10.1109/PATMOS.2017.8106969

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Leonidas Katselas, Hailong Jiao, Angelos Athanasiadis, Christos Papameletis, Alkis A. Hatzopoulos, Erik Jan Marinissen:
Embedded toggle generator to control the switching activity during test of digital 2D-SoCs and 3D-SICs. PATMOS 2017: 1-8

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