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"A Parallel Transitive Closure Computation Algorithm for VLSI Test Generation."

Seema Bawa, G. K. Sharma (2002)

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DOI: 10.1007/3-540-48051-X_25

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-17

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Seema Bawa, G. K. Sharma:
A Parallel Transitive Closure Computation Algorithm for VLSI Test Generation. PARA 2002: 243-252

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