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"Measurement of a system-adaptive error-detection sequential circuit with ..."

Matthew J. Turnquist et al. (2011)

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DOI: 10.1109/NORCHP.2011.6126746

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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  dblp key:
  - conf/norchip/TurnquistLMK11
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Matthew J. Turnquist, Erkka Laulainen, Jani Mäkipää, Lauri Koskinen:
Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL. NORCHIP 2011: 1-4

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