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"Locally Most Powerful Bayesian Test for Out-of-Distribution Detection ..."

Keunseo Kim, Juncheol Shin, Heeyoung Kim (2021)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2022-05-03

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  - electronic edition @ neurips.cc (open access)
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  dblp key:
  - conf/nips/KimSK21
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  persistent URL:
  - https://dblp.org/rec/conf/nips/KimSK21
Keunseo Kim, Juncheol Shin, Heeyoung Kim:
Locally Most Powerful Bayesian Test for Out-of-Distribution Detection using Deep Generative Models. NeurIPS 2021: 14913-14924

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