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"Contributions of SRAM, FF and combinational circuit to chip-level ..."
Liao Wang et al. (2017)
- Liao Wang, Soichi Hirokawa, Ryo Harada, Masanori Hashimoto:
Contributions of SRAM, FF and combinational circuit to chip-level neutron-induced soft error rate: - Bulk vs. FD-SOI at 0.5 and 1.0V -. NEWCAS 2017: 33-36
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