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"A novel technique to characterize the spatial intra-pixel sensitivity ..."

Swaraj Mahato et al. (2017)

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DOI: 10.1109/NEWCAS.2017.8010180

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - conf/newcas/MahatoRMRW17
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Swaraj Mahato, J. De Ridder, Guy Meynants, Gert Raskin, Hans Van Winckel:
A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor. NEWCAS 2017: 361-364

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