"Charge accumulation and their relaxation in SiO2 films containing silicon ..."

Gang Li, Haisheng San, Xuyuan Chen (2010)

Details and statistics

DOI: 10.1109/NEMS.2010.5592259

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

a service of  Schloss Dagstuhl - Leibniz Center for Informatics