"Analysis and Simulation of Temperature Characteristic of Sensitivity for ..."

Bin Wang et al. (2015)

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DOI: 10.1007/978-3-662-49283-3_17

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-16

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  dblp key:
  - conf/nccet/WangZLXXH15
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  - https://dblp.org/rec/conf/nccet/WangZLXXH15
Bin Wang, Yun Zeng, Guoli Li, Yu Xia, Hui Xu, Caixia Huang:
Analysis and Simulation of Temperature Characteristic of Sensitivity for SOI Lateral PIN Photodiode Gated by Transparent Electrode. NCCET 2015: 173-181

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