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"RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs."

Joseph Nguyen et al. (2016)

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DOI: 10.1109/NATW.2016.14

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
  - conf/natw/NguyenTBLCCGCG16
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  - https://dblp.org/rec/conf/natw/NguyenTBLCCGCG16
Joseph Nguyen, David Turgis, David Bonciani, Brice Lhomme, Yann Carminati, Olivier Callen, Guillaume Guirleo, Lorenzo Ciampolini, Gérard Ghibaudo:
RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs. NATW 2016: 28-33

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