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"Detecting a trojan die in 3D stacked integrated circuits."

Soha Alhelaly et al. (2017)

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DOI: 10.1109/NATW.2017.7938027

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/natw/AlhelalyDMGNC17
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  - https://dblp.org/rec/conf/natw/AlhelalyDMGNC17
Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch:
Detecting a trojan die in 3D stacked integrated circuits. NATW 2017: 1-6

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