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ORCID"Evolution of radiation-induced soft errors in FinFET SRAMs under process ..."
Pablo Royer, Fernando García-Redondo, Marisa López-Vallejo (2015)
- Pablo Royer, Fernando García-Redondo
, Marisa López-Vallejo:
Evolution of radiation-induced soft errors in FinFET SRAMs under process variations beyond 22nm. NANOARCH 2015: 112-117
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