"Analysis of defect tolerance in molecular electronics using ..."

Jianwei Dai, Lei Wang, Faquir C. Jain (2007)

> Home

Details and statistics

DOI: 10.1109/NANOARCH.2007.4400853

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/nanoarch/Dai0J07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/nanoarch/Dai0J07
Jianwei Dai, Lei Wang, Faquir C. Jain:
Analysis of defect tolerance in molecular electronics using information-theoretic measures. NANOARCH 2007: 21-26

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.