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"Analysis of defect tolerance in molecular electronics using ..."

Jianwei Dai, Lei Wang, Faquir C. Jain (2007)

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DOI: 10.1109/NANOARCH.2007.4400853

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/nanoarch/Dai0J07
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  persistent URL:
  - https://dblp.org/rec/conf/nanoarch/Dai0J07
Jianwei Dai, Lei Wang, Faquir C. Jain:
Analysis of defect tolerance in molecular electronics using information-theoretic measures. NANOARCH 2007: 21-26

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