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"A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS."

Andrew Ash, John Hu (2023)

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DOI: 10.1109/MWSCAS57524.2023.10405901

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Andrew Ash, John Hu:
A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS. MWSCAS 2023: 167-171

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