Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Statistical Shape Model and SVMs Based Scheme for Visual Inspection of ..."

Guifang Duan, Yen-Wei Chen (2011)

> Home

Details and statistics

DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2021-03-02

- view
  - electronic edition @ mva-org.jp (open access)
- export record
  dblp key:
  - conf/mva/DuanC11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mva/DuanC11
Guifang Duan, Yen-Wei Chen:
A Statistical Shape Model and SVMs Based Scheme for Visual Inspection of Microdrill Bits in PCB Production. MVA 2011: 235-238

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.