"A Novel Method for Silicon Configurable Test Flow and Algorithms for ..."

Swapnil Bahl (2004)

> Home

Details and statistics

DOI: 10.1109/MTDT.2004.2

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  - electronic edition @ ieeecomputersociety.org
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/mtdt/Bahl04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mtdt/Bahl04
Swapnil Bahl:
A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller. MTDT 2004: 78-83

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.