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"Development of a transmission line model for the thickness prediction of ..."

C. Mpilitos et al. (2018)

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DOI: 10.1109/MOCAST.2018.8376575

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-30

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C. Mpilitos, Nikolaos V. Kantartzis, Stamatios A. Amanatiadis, George Apostolidis, George Karagiannis, Theodoros T. Zygiridis:
Development of a transmission line model for the thickness prediction of thin films via the infrared interference method. MOCAST 2018: 1-4

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