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"Local Fading Memory Effects in a Tantalum Oxide ReRAM Cell from Hewlett ..."

Alon Ascoli et al. (2023)

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DOI: 10.1109/METROXRAINE58569.2023.10405685

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-16

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Alon Ascoli, Nicolas Schmitt, Ioannis Messaris, Ahmet Samil Demirkol, Ronald Tetzlaff, John Paul Strachan, Leon O. Chua:
Local Fading Memory Effects in a Tantalum Oxide ReRAM Cell from Hewlett Packard Labs. MetroXRAINE 2023: 971-976

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