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"IEEE International Conference on Metrology for eXtended Reality, ..."

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DOI: 10.1109/METROXRAINE58569.2023

access: closed

type: Editorship

metadata version: 2024-02-16

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  - https://dblp.org/rec/conf/metroxraine/2023
IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023, Milano, Italy, October 25-27, 2023. IEEE 2023, ISBN 979-8-3503-0080-2 [contents]

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