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"General Cephalometric Landmark Detection for Different Source of X-Ray Images."
Cristian Millán-Arias et al. (2023)
- Cristian Millán-Arias, Bruno J. T. Fernandes, Sérgio Fernandes, Mavio Bispo:
General Cephalometric Landmark Detection for Different Source of X-Ray Images. LA-CCI 2023: 1-6
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