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"Research on Test Flakiness: from Unit to System Testing."

Kiet Ngo, Vu Nguyen, Tien N. Nguyen (2022)

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DOI: 10.1145/3551349.3563242

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-22

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  dblp key:
  - conf/kbse/NgoNN22
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  - https://dblp.org/rec/conf/kbse/NgoNN22
Kiet Ngo, Vu Nguyen, Tien N. Nguyen:
Research on Test Flakiness: from Unit to System Testing. ASE 2022: 218:1-218:4

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