Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"ESD-Induced Internal Core Device Failure: New Failure Modes in ..."

Yoon Huh et al. (2005)

> Home

Details and statistics

DOI: 10.1109/IWSOC.2005.58

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iwsoc/HuhBMCNJV05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iwsoc/HuhBMCNJV05
Yoon Huh, Peter Bendix, Kyungjin Min, Jau-Wen Chen, Ravindra Narayan, Larry D. Johnson, Steven H. Voldman:
ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. IWSOC 2005: 47-53

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.