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"Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep ..."

Francisco López de la Rosa et al. (2022)

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DOI: 10.1007/978-3-031-06527-9_35

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  dblp key:
  - conf/iwinac/RosaGKMF22
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  - https://dblp.org/rec/conf/iwinac/RosaGKMF22
Francisco López de la Rosa, José L. Gómez-Sirvent, Corinna Kofler, Rafael Morales, Antonio Fernández-Caballero:
Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach. IWINAC (1) 2022: 356-365

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