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"Defect Analysis and Prediction by Applying the Multistage Software ..."

Jieming Chi et al. (2017)

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DOI: 10.1109/IWESEP.2017.16

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/iwesep/ChiHWFMMUY17
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  persistent URL:
  - https://dblp.org/rec/conf/iwesep/ChiHWFMMUY17
Jieming Chi, Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa, Kazuki Munakata, Sumie Morita, Tadahiro Uehara, Rieko Yamamoto:
Defect Analysis and Prediction by Applying the Multistage Software Reliability Growth Model. IWESEP 2017: 7-11

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