"Anti-SEU design of SRAM based on FinFET process."

Man Zhang, Lijun Zhang, Yiping Zhang (2020)

Details and statistics

DOI: 10.1109/IWCMC48107.2020.9148056

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-04

a service of  Schloss Dagstuhl - Leibniz Center for Informatics