"Deep Convolutional Neural Networks with Residual Blocks for Wafer Map ..."

Zemenu Endalamaw Amogne, Fu-Kwun Wang, Jia-Hong Chou (2021)

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DOI: 10.1007/978-3-030-85030-2_31

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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Zemenu Endalamaw Amogne, Fu-Kwun Wang, Jia-Hong Chou:
Deep Convolutional Neural Networks with Residual Blocks for Wafer Map Defect Pattern Recognition. IWANN (1) 2021: 372-384

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