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"Generalization of supervised learning for binary mask estimation."

Tobias May, Timo Gerkmann (2014)

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DOI: 10.1109/IWAENC.2014.6953357

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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  dblp key:
  - conf/iwaenc/MayG14
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Tobias May, Timo Gerkmann:
Generalization of supervised learning for binary mask estimation. IWAENC 2014: 154-158

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