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"A built-in self-test scheme for 3D RAMs."
Yun-Chao You et al. (2012)
- Yun-Chao You, Che-Wei Chou, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu
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A built-in self-test scheme for 3D RAMs. ITC 2012: 1-9
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