"IDDQ test using built-in current sensing of supply line voltage ..."

Bin Xue, D. M. H. Walker (2005)

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DOI: 10.1109/TEST.2005.1584061

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Bin Xue, D. M. H. Walker:
I_DDQ test using built-in current sensing of supply line voltage drop. ITC 2005: 10

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