BibTeX record conf/itc/WheaterNML94

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@inproceedings{DBLP:conf/itc/WheaterNML94,
  author    = {Donald L. Wheater and
               Phil Nigh and
               Jeanne Trinko Mechler and
               Luke Lacroix},
  title     = {{ASIC} Test Cost/Strategy Trade-offs},
  booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
               Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages     = {93--102},
  publisher = {{IEEE} Computer Society},
  year      = {1994},
  url       = {https://doi.org/10.1109/TEST.1994.527940},
  doi       = {10.1109/TEST.1994.527940},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/WheaterNML94.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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