"Using built-in self-test and adaptive recovery for defect tolerance in ..."

Zhanglei Wang, Krishnendu Chakrabarty (2005)

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DOI: 10.1109/TEST.2005.1584008

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Zhanglei Wang, Krishnendu Chakrabarty:
Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics. ITC 2005: 10

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