"Analog/Digital Testing of Loaded Boards Without Dedicated Test Points."

Christophe Vaucher, Louis Balme (1996)

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DOI: 10.1109/TEST.1996.556978

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Christophe Vaucher, Louis Balme:
Analog/Digital Testing of Loaded Boards Without Dedicated Test Points. ITC 1996: 325-332

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