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"On-chip Test and Repair of Memories for Static and Dynamic Faults."

Sanjay K. Thakur, Rubin A. Parekhji, Arun N. Chandorkar (2006)

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DOI: 10.1109/TEST.2006.297687

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  - https://dblp.org/rec/conf/itc/ThakurPC06
Sanjay K. Thakur, Rubin A. Parekhji, Arun N. Chandorkar:
On-chip Test and Repair of Memories for Static and Dynamic Faults. ITC 2006: 1-10

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