Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Automatic Structural Test Generation for Analog Circuits using Neural Twins."

Jonti Talukdar et al. (2022)

> Home

Details and statistics

DOI: 10.1109/ITC50671.2022.00022

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/TalukdarCBC22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/TalukdarCBC22
Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty:
Automatic Structural Test Generation for Analog Circuits using Neural Twins. ITC 2022: 145-154

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.