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"A/MS benchmark circuits for comparing fault simulation, DFT, and test ..."

Stephen Sunter, Peter Sarson (2017)

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DOI: 10.1109/TEST.2017.8242079

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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Stephen Sunter, Peter Sarson:
A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. ITC 2017: 1-7

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