"Exploiting path delay test generation to develop better TDF tests for ..."

Ankush Srivastava et al. (2017)

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DOI: 10.1109/TEST.2017.8242072

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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Ankush Srivastava, Adit D. Singh, Virendra Singh, Kewal K. Saluja:
Exploiting path delay test generation to develop better TDF tests for small delay defects. ITC 2017: 1-10

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