"IC Defects-Based Testability Analysis."

José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira (1991)

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DOI: 10.1109/TEST.1991.519712

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-05

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José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira:
IC Defects-Based Testability Analysis. ITC 1991: 500-509

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