BibTeX record conf/itc/RaymondWSNJPS95

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@inproceedings{DBLP:conf/itc/RaymondWSNJPS95,
  author    = {Douglas W. Raymond and
               D. Eugene Wedge and
               Philip J. Stringer and
               Harold W. Ng and
               Suzanne T. Jennings and
               Craig T. Pynn and
               Winsor Soule Jr.},
  title     = {Algorithmic Extraction of {BSDL} from 1149.1-compliant Sample ICs},
  booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
               the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages     = {561--568},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  url       = {https://doi.org/10.1109/TEST.1995.529884},
  doi       = {10.1109/TEST.1995.529884},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/RaymondWSNJPS95.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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