BibTeX record conf/itc/RaymondHBRM94

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@inproceedings{DBLP:conf/itc/RaymondHBRM94,
  author    = {Douglas W. Raymond and
               Dominic F. Haigh and
               Ray Bodick and
               Barbara Ryan and
               Dale McCombs},
  title     = {Non-Volatile Programmable Devices and In-Circuit Test},
  booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
               Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages     = {817--823},
  publisher = {{IEEE} Computer Society},
  year      = {1994},
  url       = {https://doi.org/10.1109/TEST.1994.528029},
  doi       = {10.1109/TEST.1994.528029},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/RaymondHBRM94.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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