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"Statistical Delay Fault Coverage and Defect Level for Delay Faults."

Eun Sei Park, Thomas W. Williams, M. Ray Mercer (1988)

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Details and statistics

DOI: 10.1109/TEST.1988.207761

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/itc/ParkWM88
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Eun Sei Park, Thomas W. Williams, M. Ray Mercer:
Statistical Delay Fault Coverage and Defect Level for Delay Faults. ITC 1988: 492-499

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