BibTeX record conf/itc/OhKCCPPL94

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@inproceedings{DBLP:conf/itc/OhKCCPPL94,
  author    = {Sangchul Oh and
               Jae{-}Ho Kim and
               Ho{-}Jeong Choi and
               Si{-}Don Choi and
               Ki Tae Park and
               Jong{-}Woo Park and
               Wha{-}Joon Lee},
  title     = {Automatic Failure-Analysis System for High-Density {DRAM}},
  booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
               Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages     = {526--530},
  publisher = {{IEEE} Computer Society},
  year      = {1994},
  url       = {https://doi.org/10.1109/TEST.1994.527995},
  doi       = {10.1109/TEST.1994.527995},
  timestamp = {Wed, 09 Sep 2020 17:35:09 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/OhKCCPPL94.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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