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"Automatic Test Plan Generation for Analog and Mixed Signal Integrated ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Ravindranath Naiknaware, G. N. Nandakumar, Srinivasa Rao Kasa (1993)

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DOI: 10.1109/TEST.1993.470708

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  - https://dblp.org/rec/conf/itc/NaiknawareNK93
Ravindranath Naiknaware, G. N. Nandakumar, Srinivasa Rao Kasa:
Automatic Test Plan Generation for Analog and Mixed Signal Integrated Circuits using Partial Activation and High Level Simulation. ITC 1993: 139-148

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