"Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost."

Alan F. Murray, Peter B. Denyer, David Renshaw (1983)

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type: Conference or Workshop Paper

metadata version: 2024-11-05

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Alan F. Murray, Peter B. Denyer, David Renshaw:
Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost. ITC 1983: 260-268

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