BibTeX record conf/itc/MadgeGRMDSTT02

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@inproceedings{DBLP:conf/itc/MadgeGRMDSTT02,
  author    = {Robert Madge and
               B. H. Goh and
               V. Rajagopalan and
               C. Macchietto and
               W. Robert Daasch and
               Chris Schuermyer and
               C. Taylor and
               David Turner},
  title     = {Screening MinVDD Outliers Using Feed-Forward Voltage Testing},
  booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  pages     = {673--682},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://doi.org/10.1109/TEST.2002.1041819},
  doi       = {10.1109/TEST.2002.1041819},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/MadgeGRMDSTT02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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