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"A structured approach to post-silicon validation and debug using symbolic ..."

David Lin et al. (2015)

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DOI: 10.1109/TEST.2015.7342397

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

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David Lin, Eshan Singh, Clark W. Barrett, Subhasish Mitra:
A structured approach to post-silicon validation and debug using symbolic quick error detection. ITC 2015: 1-10

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