"Efficient Latch and Clock Structures for System-on-Chip Test Flexibility."

David E. Lackey (2006)

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DOI: 10.1109/TEST.2006.297657

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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David E. Lackey:
Efficient Latch and Clock Structures for System-on-Chip Test Flexibility. ITC 2006: 1-7

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