"Wafer-Level Characterization of Probecards using NAC Probing."

Gyu-Yeol Kim et al. (2008)

Details and statistics

DOI: 10.1109/TEST.2008.4700571

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics