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"Wafer-Level Characterization of Probecards using NAC Probing."
Gyu-Yeol Kim et al. (2008)
- Gyu-Yeol Kim, Eon-Jo Byunb, Ki-Sang Kang, Young-Hyun Jun, Bai-Sun Kong:
Wafer-Level Characterization of Probecards using NAC Probing. ITC 2008: 1-9
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